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Silicon Nitride

SiNₓ
Deposition: PVD — Sputter & Evaporator
Category: Nitride
Formula: SiNₓ

Silicon nitride (SiNₓ) films by RF magnetron sputtering. A 37 nm film shows n = 2.012 @ 587 nm (2.061 @ 1525 nm) with near-zero extinction — a passivation and photonic-waveguide staple. Targets: 99.99 %, 3 in.

Specifications

Thin-Film Specifications

Silicon Nitride characterization data 1
Silicon Nitride characterization data 2
Silicon Nitride characterization data 3
  • Film-coated by RF magnetron sputtering vacuum < 1.0 × 10⁻⁶ Torr
  • Substrate : Si (100)
  • Thickness : 37.035 nm
  • Refractive Index (n) : 2.011712 (@ 587 nm) / 2.061467 (@ 1525 nm)
  • Extinction Coefficient (k) : 0.000066 (@ 587 nm) / 0.000000 (@ 1525 nm)

Target Specifications

  • Target Material : Silicon Nitride
  • Purity : 99.99%
  • Diameter : 3”
Silicon Nitride sputtering target Target