VANAM — VANA Materials LAB. VANAM — VANA Materials LAB.

Products

Thin films,
off the shelf

Order standard samples and services directly. For custom deposition, request a quote and we'll price it for you.

No account needed — checkout as a guest.

How a deposition order works

From your specifications to a film in your hands.

  1. 01

    Request

    Tell us the material, substrate and process conditions you need.

  2. 02

    Expert review

    Our team checks feasibility and pre-/post-process requirements.

  3. 03

    Quotation

    We send a price and lead time for your exact specifications.

  4. 04

    Deposition

    We run the process on our own equipment, collecting process data throughout.

  5. 05

    Quality check

    Basic inspection before shipping. Further analysis available on request.

  6. 06

    Shipping

    The film ships to you. Device fabrication can follow if needed.

Analysis & Measurement Solution

From non-destructive spectroscopy to electrical characterisation.

Material analysis

  • SEM (include EDS) Scanning electron microscopy
  • TEM (include EDS) Transmission electron microscopy
  • XRD X-ray diffraction — crystallinity
  • XPS X-ray photoelectron spectroscopy
  • UPS UV photoelectron spectroscopy
  • AFM Atomic force microscopy
  • Raman Raman spectroscopy

Device characterisation

  • I–V Current–voltage characteristics
  • C–V Capacitance–voltage characteristics
  • Pulse Pulse measurement
  • Ferroelectric Polarisation hysteresis
  • Piezoelectric Piezoresponse measurement
  • Hall Hall effect measurement
  • PPMS Physical property measurement system (2 K ~ 400 K)

Equipment Solution

Deposition tools built in-house with vacuum specialists of 30+ years — every one of them instrumented for process data.

PVD & ALD

Sputtering, thermal evaporator, in-line sputter, 6-inch and 12-inch ALDs

Sputter

Sputter

In-line Sputter

In-line Sputter

Thermal Evaporator

Thermal Evaporator

ALD — 6-inch

ALD — 6-inch

ALD — 12-inch

ALD — 12-inch

Process Big Data Collection System

In-situ collection of plasma emission, residual gas, and key process parameters. The collected data supports machine-learning-based process optimization and material-property prediction.

01 IN-SITU SENSING Self-developed sputter · 3 real-time sensors
02 BIG DATA + AI Collection · training · analysis
03 OUTCOMES Optimization · prediction
Self-developed sputter system with RGA, OES and TSP sensors highlighted
RGA OES TSP

Self-developed Sputter

RGA — Residual Gas Analyzer · OES — Optical Emission Spectrometer · TSP — Titanium Sublimation Pump

RGA residual gas analyzer device
Measured residual gas spectrum from RGA

RGA — analyzer · measured spectrum

OES optical emission spectrometer device
Optical emission spectrum graph from OES

OES — spectrometer · emission spectrum

Big Data + AI

Process-data collection · machine-learning training

AI-driven thin film process optimization

Process Optimization

Thin film process optimization

Machine-learning characteristic prediction model dashboard

Property Prediction Model

Characteristic prediction model